KEYCOM provides solutions in the 300 GHz to 1 μHz frequency range (SHF/EHF/MW/UHF/VHF/ULF).
We undertake designing, manufacturing and measuring. Please feel free to contact us.

Electric wave absorption rate measurement Service
(in near-field / in far-field)

Model No. SEAS

With our experience of measuring the Electric wave absorption rate(Electric wave absorber, Noise suppression sheet / In near-field, In far-field )of over 1000 samples per year and in developing measurement devices, Keycom offers precise measurement methods and devices that make it possible to obtain accurate values quickly.

Devices developed by Keycom for the measurement of the specific electric permittivities and rates of absorption of radio waves have been standardized by IEC and JIS. As well as applying high technology in devices for measuring electric permittivities, Keycom has accumulated considerable experience in measuring electric permittivity, handling over 1000 samples each year. Also, based on its experience developing measurement devices, Keycom offers precise measurement methods and devices and makes it possible to obtain and report values accurately and quickly.

* The device developed by Keycom for the measurement of electrical permittivities has been put forward for IEC and JIS standardization.

* Keycom has extensive experience regarding dielectric and magnetic materials and develops practical measurement devices for measuring specific electric and magnetic permittivities with extremely high accuracy. Keycom also develops systems applicable for specific targets, such as flexible boards, semiconductors, thin films, microwave and millimeter-wave boards, microwave and millimeter-wave resonators, and liquids.

Measurable ranges

Only basic information is shown. Please do not hesitate to contact us with requests regarding custom samples.
  Type Frequency Range Sample Size
In far-field •Vertical incidence type
•Diagonal incidence type
(1GHz)2.6GHz-26.5GHz
About 450mm×450mm
(300mm×300mm or more)
26.5-110GHz
About 250mm×250mm
In near-field For near-field 0.1GHz-3GHz 100mm×50mm or more
3GHz-18GHz
18GHz-40GHz

Devices developed by Keycom for the measurement of the electric/magnetic permittivities and rates of absorption of radio waves have been standardized by the Japan Industrial Standards (JIS).

→Methods for measuring the dielectric characteristics of fine ceramics in the millimeter-wave region
Part2:Open resonator method -JIS R 1660-2:2004-
→Noise Suppression Sheet for digital devices and equipment 
Part2:Definitions and general Properties -IEC62333-1:2006-05-
Part3:Measuring method-IEC62333-2:2006-05-
→Methods for measuring the rate of absorption of radio waves for wave absorbers in the millimeter-wave region -JIS R 1679:2007-
→Measurement Methods for Reflectivity of Electromagnetic Wave Absorbers in Millimeter Wave Frequency -IEC62431-

Measurement Services Provided by Keycom

Our rich experience in providing measurement services enables us here at Keycom to offer precise measurement methods and equipment that makes it possible to obtain accurate values quickly.

→ Usual delivery period: 1 week (negotiable if express delivery is required)
→ Delivery at the end of the year or other busy periods: 2 weeks (negotiable if express delivery is required)
→ Delivery in the case of time-consuming measurements: 2~3 weeks (negotiable if express delivery is required)

Even in the case of measurements that require complex technology or that are not available at the current time, if such measurements are theoretically possible, Keycom will do its best to realize them by utilizing our experience developing various measurement devices. Please call us for a consultation (note that the delivery period is longer than usual, at 3 weeks or more).

Example: Measurement method developed in November 2005→ measurement of the electric permittivity and the dielectric tangent for ultrathin films (0.01μm) with low-frequency waves.

Contact Us

E-mail:info@keycom.co.jp  FAX:+81- 3-5950-3380 TEL +81-3-5950-3101)
Please feel free to contact us any time, providing the following information (you may omit non-applicable fields).

* Contact details
* Desired frequency for the measurements
* Configuration of the sample (please provide the maximum size of the object: thickness x height x width, as well as the number of samples).
* Information regarding the sample material(s)
* Important points regarding the handling of the sample (conductivity, volatility, etc.)
* Desired temperature for performing the measurements (normal temperature, etc.)
* Please provide detailed information in case the sample needs to be prepared by Keycom (e.g. 48% alcohol solution)