KEYCOM provides solutions in the 300 GHz to 1 μHz frequency range (SHF/EHF/MW/UHF/VHF/ULF).
We undertake designing, manufacturing and measuring. Please feel free to contact us.

Dielectric Constant(Permittivity, εr') , Dielectric Loss Tangent(tanδ), Permeability(μr') Measurement System

Model No. DPS

KEYCOM develops and manufactures highly accurate and dependable
measurement systems for permittivity, dielectric loss tangent, or permeability
by leveraging its accumulated experience and expertise over a long period of time.
Capitalizing on such experience and expertise, KEYCOM is committed to
developing customized solutions for wide range of specific applications such as
flexible circuit board, semiconductor, thin film, millimeter wave and microwave frequency board,
millimeter and microwave resonator or liquids to meet the market demands.

The features of our systems include:
-High measurement accuracy: ±1%
-Non destructive 
-Support for submillimeter ultra-thin membrane
-Support for various specimen forms such as solid, sheet, film, powder, or liquid (oil), multi-layered
-Measurement frequency range: 10 μHz -110 GHz (using multiple systems)


How to select the measurement methods

Selecting Dielectric Constant Measurement Method

Select from specimens

  Title Ref. No. Frequency ex) Sample Feature
1. Open type Resonator method DPS03 18GHz~110GHz Multilayer material
Printed board
Film(Ultra thin film)
Powder
Sheet(Board)
Radome cover
Ceramics
Dielectric resonator
Ferroelectric
Resonator method series
For low tan delta materials
High accuracy
Point frequency
2. Perturbation type Resonator method DPS18 200MHz~10GHz
3. Strip line type Resonance method DPS50 800MHz~14GHz
4. Micro strip line type Resonance method DPS01 800MHz~14GHz
5. Circular Disk type Resonator method DPS51 3GHz~70GHz
6. LC Resonator method DPS26 10MHz, 50MHz, 100MHz
7. Parallel conductor plate type
Dielectric resonator method
DPS14 3GHz~26.5GHz
8. Frequency change method DPS10 2.6GHz~110GHz Multilayer material
Printed board
Powder
Board
Phantom
Wave absorber
Radome cover
Frequency change method series
For low tan delta and thick materials
9. Frequency change method Coaxial tube and waveguide type DPS09 10MHz~60GHz
10. Probe type (open mode) DPS16 30MHz~90GHz Multilayer material
Sheet(Board)
Phantom material
Wave absorber
Noise suppression sheet
Soil
Concrete, Asphalt
Radome cover
Fruit, Vegetable
Liquid
S parameter method series
For highr tan delta materials
Wide coverage of frequency
Permeability is measureable (12, 13. 14)
11. Probe type (short mode) DPS25 100kHz~10GHz
12. Coaxial Tube and Waveguide Type S-parameter method DPS08 12MHz~40GHz
13. Free space frequency change type S-parameter method DPS24 2.6GHz~110GHz
14. Free space Angle of incidence change type S-parameter method DPS22 2.6GHz~110GHz
15. Propagation Delay Mode Cut Back Type
Coaxial Tube Method
DPS05 45MHz~40GHz
16. Capacitance method DPS17 1Hz~1GHz Multilayer material
Printed board
Film(Ultra thin film)
Sheet(Board)
Phantom material
Noise suppression sheet
Liquid
Ceramics
Semiconductor
Capacitance method series
For low frequency
High accuracy
Wide coverage of frequency
17. MOSFET structure semiconductor depletion layer
And just below the gate electrode dielectric film
DPS48 20Hz~2MHz
18. Ellipsometry method DPS02 26.5~110GHz   Ellipsometry method
Dielectric cnstant,
permeability measurement


Select from measurement frequency, dielectric constant, dielectric loss tangent

Select from measurement frequency, dielectric constant, dielectric loss tangent

Select from measurement frequency, method, specimen size

Select from measurement frequency, method, specimen size

Select from specific request


The following table is based on FAQ. Please contact us for details.
When you want to measure an ultra thin film on the printed board with high accuracy
(measurement of film, multilayer material)
» Perturbation method
When your sample is so thin it falls apart without supporting medium
(measurement of film, multilayer material)
» Perturbation method
When high accuracy is the priority (εr' ±1% tanδ ±3%) » Perturbation method
When you only have a sample as small as 1mm » Probe method
When you want to measure it in high accuracy by super-high frequency.
(20GHz - 110GHz)
» Resonance method
resonator open type
When you want to measure it by super-low frequency.(10μHz - 10Hz) » Capacitance method
When you want to measure liquid » Probe method
When you want to measure powder » Probe method
When you want to measure volatile substance such as gasoline » Probe method
When you want to change the measurement temperature » Capacitance method
When you want to sweep frequency and obtain rough result, accuracy is less importan (εr' ± 7% tanδ ± 10%) » S-parameter method
When you do not want your sample cut or reshaped (Non-destructive) » Resonance method
micro strip line type
When you want the process as simple as possible » Probe method
When you want to measure dielectric constant, dielectric loss tangent,and permeability at once » S-parameter method

Features of KEYCOM's measurement systems and measurement technologies

Features of KEYCOM's measurement systems and measurement technologies

* Our abundant experience through numerous measurement services enable us to suggest you the most suitable measurement techniques and instruments.
* Our extensive knowledge and expertise allow us to come through with your technical expectations in the quickest manner possible.
* Hirosuke Suzuki, our CEO, is a member of Standardization Planning Committee of IEC(International Electrotechnical Commission).
* KEYCOM’s dielectric constant and permeability measurement systems, along with the electromagnetic-absorption-ratio measurement system have been IEC and JIS(Japanese Industrial standard) standardized.

On KEYCOM's dielectric constant and permeability measurement systems

* KEYCOM provides solutions for almost any forms of specimen such as solid, sheet, film, powder, liquid (oil), or multi-layered.
Our rich experiences in measurements services, custom manufacturing and developments of high frequency components or
cables are the keys to your solutions
* KEYCOM provides solutions for measurement request between 10μHz~110GHz.
* In the microwave frequency range, we offer solutions in accuracy of ±1%(εr) and the ±3%(tan δ).
* In the millimeter wave frequency range, we offer solutions in accuracy of ±3%(εr) and the ±7%(tan δ).
* KEYCOM participates in the standardization committee of IEC and JIS.
* Like any other field, KEYCOM is committed to coming through with your technical expectations in the quickest manner possible with our extensive knowledge and expertise in this field as well.


Contents

Resonance method(JIS enacted open-type resonance method JIS R 1660-2)
(CEO, Hirosuke Suzuki, participated in the standardization committee in the spring of 2004.)

Open resonator method for sheet and ultra thin sheet dielectric constant and dielectric loss tangent(millimeterwave) measurement system
dps03002990714-18
KEYCOM’s ultra­-thin sheet measurement system employs the Fabry-Perot resonator, a liner optical resonator which consists of two highly reflecting mirrors, which combines the high measurement accuracy in the millimeter wave range and simplicity of installing the specimens.
It is also ideal for specimens with low tanδ.
This method was presented at 2005 IEEE Instrumentation and Measurement Technology Conference Ottawa Ontario, CANADA.
*JIS code : R 1660-2
*Publication :
H.Suzuki, T.Kamijo
“Millimeter wave measurement of complex permittivity by perturbation method using open resonator”
IEEE Trans. Instrument and Measurement
VOL.57. No.12, Dec.2008
pp2868-2873
* High accuracy : εr' ± 3% , tan δ ± 7%
* Ultra-thin films with thicknesses of 10 - 100 μm measurable
* Simple to operation
* Measurement requency range: 18 GHz - 110 GHz
Resonance method strip line type for sheet dielectric constant and dielectric loss tangent measurement system
dps50002070405-07
In frequency range from 800MHz to 14GHz, it is the measurement system of εr'and tanδ , for sheet material of small dielectric loss tangent and 1-40 εr'.
We follow the ASTMD3380-75 Standard method of Test for Permittivity(Dielectric Constant) and Dissipation Factor of Plastic-Based Microwave Circuit Substrates and IPC-L-125 Specification for Plastic Substrates, Clad or Unclad, for High Speed / High Frequency Interconnections.
Resonance method micro strip line type for sheet and ultra thin sheet dielectric constant and dielectric loss tangent measurement system
dps01002000313-08
This is a measurement equipment and system which measures εr and tanδ of the material that the dielectric substance loss is comparatively small, and εr is roughly 1 from 40 in the frequency being from 800MHz to 14GHz.
It is a measurement kit that conforms to ASTMD3380-75 Standard method of Test for Dielectric Constant and Dissipation Factor of Plastic-Based Microwave Circuit Substrates, IPC-L-125 Specification for Plastic Substrates, Clad or Unclad, and for High Speed/High Frequency Interconnections and it can measure εr and tanδof the ultra thin dielectric substance sheet.

Perturbation method

Perturbation method specimen-hole closed type, cavity resonance mode, for ultra thin sheet dielectric constant and dielectric loss tangent measurement system
dps18002031022-11
KEYCOM’s high precision perturbation method enables you to measure dielectric constant (permittivity, εr) and dielectric loss tangent (tan δ) of such specimens as multi-layered structure, ultra-thin film or ferroelectric materials in the microwave region.
KEYCOM refined the conventional perturbation method that was JIS-standardized in 1992 (JISC2565) by closing the hole into which the specimen is inserted with metal, and the new method is also compliant with ASTMD2520.
* High accuracy : εr' accuracy ±1%, tan δ accuracy ±3%.
* Capable of meeasuring Ultra-thin films (less than 0.1μm in thickness), multi-layer film
* Also ideal for solids, sheets, powders, liquids (oils, etc.)
* User-friendly operability.
* Measurement frequency range : 200 MHz - 10 GHz.

Propagation delay method

Propagation delay mode cut back type coaxial tube method dielectric constant and dielectric loss tangent measurement system
dps05002981027-10
In the 45 MHz-40 GHz frequency range, this system measures permittivity(dielectric constant, εr) and dielectric loss tangent(tan δ) of liquids having εr of approximate 1.05-500. It can also estimate the voltage dependence of εr and tan δ for samples such as liquid crystals by applying a bias voltage during the measurement.
Propagation delay mode cut back type Free space method dielectric constant and dielectric loss tangent measurement system
dps06002000831-05
In the 45 MHz-40 GHz frequency range, this system measures dielectric constant/permittivity and dielectric loss tangent of the materials which have dielectric constant of approximate 1.05-500. Especially it greatly contributes to large loss specimens
Propagation delay mode Cut Back type Coplanar line method dielectric constant and dielectric loss tangent measurement system
dps07002010619-24
This system measures the permittivity(dielectric constant, εr) and the dielectric loss tangent(tan δ) of liquids and powdered materials in the 500 MHz - 65 GHz frequency range. In liquid measurement, a sample covers a coplanar line to a thickness of approximately 0.2 mm. The εr and tan δ values of the liquid sample are then calculated from the actual εr and tan δ values of the dielectric complex consisting of the liquid and the coplanar line, using installed simulation software that simulates the electromagnetic field of a coplanar line. In addition, the voltage dependence of εr and tan δ for samples such as liquid crystals can be estimated by applying a bias voltage during the measurement.
Propagation delay mode Cut Back type Stripline method dielectric constant and dielectric loss tangent measurement system
dps15

In the 45 MHz-40 GHz frequency range, this system measures permittivity(dielectric constant, εr) and dielectric loss tangent(tan δ) of dielectric substance sheets and clayey materials, etc.For the measurement of powdered materials, we can provide an optional software which calculates the true εr and tan δ using a bulk specific gravity and a absolute specific gravity, and can also do a temperature measurement equipment and a calculation software of temperature dependency. The voltage dependence of εr and tan δ can be estimated by applying a bias voltage during the measurement.

Probe method

Open mode probe method dielectric constant and dielectric loss tangent measurement system
dps16002021001-11

KEYCOM offers probes with different outside diameters of 1.2mmφ, 2.2mmφ, 3.6mmφ to meet specific measurement requirements.
KEYCOM's distinduished open probe method along with the system supports up to 90GHz, whereas general probe methods only support up to 50GHz.

Features of KEYCOM probe method
- Wide frequency range, 200MHz up to 90GHz.
- Ideal for solid, liquid, and powdwer samples.
- Reference samples other than pure water are applicable (ex. acetone)

Angle of incidence change method

Angle of incidence change method dielectoric constant, dielectric loss tangent, permeability measurement system
dps22002040516-08
This system can measure the dependency on angle of incidence of the magnitude and phase of the reflection coefficient in both the TE wave and the TM wave. Complex relative permittivity and complex permeability are estimated from these measured values. Unlike the coaxial-tube-type or a waveguide-type methods, this method does not involve errors caused by air-gaps since the specimens are not installed in a fixture. Moreover, the lens attached to antenna enables to measure samples with plane wave, resulting in the high measurement accuracy. In addition, this method using a parallel beam from a antenna can reduce the size of a specimen.
In all frequency range,. εr and μr can be obtained.

Capacitance method

Capacitance method, flat plate, liquid, gel, ultra thin film, compound film, dielectric constant and dielectric loss tangent measurement system
dps17002040705-04
KEYCOM’s capacitance method/system is ideal for dielectric constant and dielectric loss tangent measurement of flat plane, liquid, or gel and capable of taking measurements in the temperature range from liquid nitrogen or -70 to 400 degrees Celsius.
Different types of electrodes are available for specific states of specimens; DPT-009 for plate, thin film, gel, DPT-012, DPT-013-050 and DPT-013-200 for liquid, and DPT-2141 for ceramic insulators.

S parameter method

S-parameter method, reflection and transmission mode, coaxial tube and waveguide type dielectric constant, dielectric loss tangent, permeability, measurement system
dps08002011118-07
KEYCOM provides S-parameter method measurement systems in two modes, the reflection mode and the transmission mode, to address the individual purposes.Both modes measure the complex permittivity (εr) and complex permeability (μr) at the same time, and the proper usage is as follows.
The optional software DMP-70 calculates the absorption ratio and the reflection ratio of electromagnetic absorbers based on the complex εr and complex μr.
S-parameter method Free space type reflection mode for flat plate dielectric constant and permeability measurement system
dps09002981027-08
Unlike the coaxial-tube-type or a waveguide-type methods, this method does not involve errors caused by air-gaps since the specimens are not installed in a fixture.
Practical data can be obtained even when the specimen is placed on a rough, uneven surface. It is compact and allows specimens to be measured by flat-wave because of the direct installment of lens with an antenna. It performs measurements by monitoring the S11 parameter via connections of a test fixture to a vector network analyzer and PC.
S-parameter method Free space type transmission mode for flat plate dielectric constant and permeability measurement system
dps21002040614-08
Unlike a coaxial tube type or a wave guide tube type, this method does not make errors caused by air-gap because specimens are not put into a fixture.
Practical data can be obtained even at the rough, uneven surfaces where the specimen is placed on. It enables compactness and measuring specimens by flat-wave because of direct installment of lens with an antenna. Measurement is achieved by monitoring S21 & S11 parameter with connections of a test fixture to a vector network analyzer and PC.

Others

Parallel conductor plate type dielectric resonator method dielectric constant and dielectric loss tangent measurement system
dps14002021001-11
This is a highly accurate measurement equipment mainly measures εr and tanδ in the micro wave band of the low loss material. It uses a columnar shape specimen. Moreover, this is a measuring method provided in JIS standard as JIS R 1627.
Eripsometore method, dielectric constant and permeability measurement system
dps02002051012-05
Because it is a scalar measurement, an expensive vector network analyzer is not required.
Moreover, dielectric constant compared with source and permeability compared with source can be requested by measuring the difference between TE TM wave of the reflection coefficient and amplitude ratio of the wave and phase.
It is unlike coaxial tube or waveguide, and the error by the airgap doesn't occur because it doesn't put the sample in Ficscha.
In addition, it is compact size because it installs a lens to an antenna.
However, you can measure a sample by plane wave.
And, the sample can be reduced, because the sample can be set in the antenna neighborhood.
And, you understand εr' and μr every frequency